The new 'Griggs' type solid medium apparatus for deformation under high temperature and pressure conditions (up to 1300 C and 6 GPa). The apparatus was installed at the Rock Deformation lab at Ben-Gurion University February 2020.

We often use the Electron backscatter diffraction (EBSD) sensor installed on a scanning electron microscopy (SEM) in the Ilse Katz Institute for Nanoscale Science & Technology at BGU. The EBSD allows constructing orientation maps of polished sections with a sub-micron step size. The EBSD is a powerful tool in the study of the deformation at grain and sub-grain scales.

Verious XHR SEM

Yuval Boneh

Lecturer

 

Department of Geological and Environmental Sciences
 

Ben-Gurion University of the Negev

Contact information:

 

Email: bonehyuv@bgu.ac.il

 

​Phone: +972-8-6461367

 

Office # 333

Grosman Building for Geology (# 58)

This site was designed with the
.com
website builder. Create your website today.
Start Now